This opportunity has closed.
Award Notice
J--SAP - Service and Repair of the XOS Sindie Monochr
Notice ID: e08b69c6272f46999e869830f9910b88Solicitation #: 68HE0M26Q0007NAICS: 334516
Posted: Closed on Mar 19, 2026
Award Value
$44K
NAICS
334516
Key Details
Description
The full description, scope of work, and requirements for this opportunity are available on SAM.gov.
View Full Description on SAM.govContext & Analysis
ENVIRONMENTAL PROTECTION AGENCY.ENVIRONMENTAL PROTECTION AGENCY.LAB - ANN ARBOR, MI - CO OFFICE posted this opportunity on Mar 19, 2026 under solicitation 68HE0M26Q0007. It is classified as a award notice notice. Work falls under NAICS 334516. Performance is expected in Ann Arbor. The award value is $44,086.
About this market
Environmental Protection Agency awards in NAICS 334516 over the last 3 years.
- Typical award size
- The median award was $46K; the middle half ran from $29K to $123K (74 priced awards).
- Competition
- 77% of 77 awards were competed; median 2 offers.
- Largest vendors
- MEASUREMENT TECHNOLOGY LABORATORIES, LLC — 3 awards, $4.0M
- AVL TEST SYSTEMS INC — 2 awards, $1.8M
- GOVERNMENT SCIENTIFIC SOURCE INC — 5 awards, $1.5M
- THERMO ELECTRON NORTH AMERICA LLC — 7 awards, $864K
- AGILENT TECHNOLOGIES INC — 11 awards, $823K
- Largest recent awards
- $1.8M to MEASUREMENT TECHNOLOGY LABORATORIES, LLC, signed Nov 26, 2025
- $1.7M to AVL TEST SYSTEMS INC, signed Nov 28, 2025
- $664K to GOVERNMENT SCIENTIFIC SOURCE INC, signed Jan 6, 2026
- $634K to DYNAMIC WALLCOVERING LLC, signed Nov 5, 2025
- $578K to THERMO ELECTRON NORTH AMERICA LLC, signed Nov 18, 2025
- Recompete pipeline
- 3 contracts of $100K or more in this market end between 90 days and 18 months from now.
Computed from USAspending award data on Oct 17, 2026.
Point of Contact
OARNVFELSACO@epa.gov
Contact information sourced from SAM.gov. Please verify before reaching out.
Award Information
Award Date: Mar 19, 2026
Award Amount: $44,086
Award Number: 68HE0M26P0050
Awardee: X-Ray Optical Systems, Inc.
Awardee Location: East Greenbush, NY
UEI: RZ1NGJXKHM23
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